TSL2568, TSL2569
LIGHT-TO-DIGITAL CONVERTER
TAOS091D  DECEMBER 2008
5
The LUMENOLOGY r Company
r
r
Copyright E 2008, TAOS Inc.
www.taosinc.com
NOTES:  2.  Optical measurements are made using small-angle incident radiation from light-emitting diode optical sources. Visible 640 nm LEDs
and infrared 940 nm LEDs are used for final product testing for compatibility with high-volume production.
3.  The 640 nm irradiance E
e
 is supplied by an AlInGaP light-emitting diode with the following characteristics: peak wavelength
籶 = 640 nm and spectral halfwidth 敾?= 17 nm.
4.  The 940 nm irradiance E
e
  is supplied by a GaAs light-emitting diode with the following characteristics: peak wavelength
籶 = 940 nm and spectral halfwidth 敾?= 40 nm.
5.  Integration time T
int
, is dependent on internal oscillator frequency (f
osc
) and on the integration field value in the timing register as
described in the Register Set section. For nominal f
osc
 = 735 kHz, nominal T
int
 = (number of clock cycles)/f
osc
.
Field value 00: T
int
 = (11 ?/SPAN> 918)/f
osc
 = 13.7 ms
Field value 01: T
int
 = (81 ?/SPAN> 918)/f
osc
 = 101 ms
Field value 10: T
int
 = (322 ?/SPAN> 918)/f
osc
 = 402 ms
Scaling between integration times vary proportionally as follows: 11/322 = 0.034 (field value 00), 81/322 = 0.252 (field value 01),
and 322/322 = 1 (field value 10).
6.  Full scale ADC count value is limited by the fact that there is a maximum of one count per two oscillator frequency periods and also
by a 2-count offset.
Full scale ADC count value = ((number of clock cycles)/2  2)
Field value 00: Full scale ADC count value = ((11 ?/SPAN> 918)/2  2) = 5047
Field value 01: Full scale ADC count value = ((81 ?/SPAN> 918)/2  2) = 37177
Field value 10: Full scale ADC count value = 65535, which is limited by 16 bit register. This full scale ADC count value is reached
for 131074 clock cycles, which occurs for T
int
 = 178 ms for nominal f
osc
 = 735 kHz.
7.  Low gain mode has 16y lower gain than high gain mode: (1/16 = 0.0625).
8.  The sensor Lux is calculated using the empirical formula shown on p. 22 of this data sheet based on measured Ch0 and Ch1 ADC
count values for the light source specified. Actual Lux is obtained with a commercial luxmeter. The range of the (sensor Lux) / (actual
Lux) ratio is estimated based on the variation of the 640 nm and 940 nm optical parameters. Devices are not 100% tested with
fluorescent or incandescent light sources.
AC Electrical Characteristics, V
DD
 = 3 V, T
A
 = 255C (unless otherwise noted)
PARAMETER
 
TEST CONDITIONS
MIN
TYP
MAX
UNIT
t
(CONV)
Conversion time
12
100
400
ms
Clock frequency (I
2
C only)
0
400
kHz
f
(SCL)
Clock frequency (SMBus only)
10
100
kHz
t
(BUF)
Bus free time between start and stop condition
1.3
t
(HDSTA)
Hold time after (repeated) start condition. After
this period, the first clock is generated.
0.6
t
(SUSTA)
Repeated start condition setup time
0.6
t
(SUSTO)
Stop condition setup time
0.6
t
(HDDAT)
Data hold time
0
0.9
t
(SUDAT)
Data setup time
100
ns
t
(LOW)
SCL clock low period
1.3
t
(HIGH)
SCL clock high period
0.6
t
(TIMEOUT)
Detect clock/data low timeout (SMBus only)
25
35
ms
t
F
Clock/data fall time
300
ns
t
R
Clock/data rise time
300
ns
C
i
Input pin capacitance
10
pF
 
Specified by design and characterization; not production tested.
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